Determine required sample sizes and acceptable measurement uncertainty based on specific Cpk targets and optical tolerances.

Simulate manufacturing yields based on Monte Carlo distributions of optical performance parameters.

Quickly convert between spatial frequencies and calculate theoretical diffraction-limited contrast.

Calculate Field of View, Ground Sample Distance, and Depth of Field for various sensor and lens combinations.

Analyze cross-site correlation data and calculate offset and scaling factors to align different metrology systems.

Utilities for basic Point Source Rejection Ratio (PSRR) and Veiling Glare Index calculations.